Fabrication of Conductive Thin Films on Precursor Polyimide via Chemical Reduction of Nickel (II) Complex
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چکیده
منابع مشابه
Conductive copper sulfide thin films on polyimide foils
Kapton polyimide is known for its high thermal stability, >400 ◦C. Copper sulfide thin films of 75 and 100 nm thickness were coated on DuPont Kapton HN polyimide foils of 25 μm thickness by floating them on a chemical bath containing copper complexes and thiourea. The coated foils were annealed at 150–400 ◦C in nitrogen, converting the coating from CuS to Cu1.8S. The sheet resistance of the ann...
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Graphene oxide (GO) thin films were simply deposited on fluorine doped tin oxide (FTO) substrate via a low-voltage electrodeposition. The GO and GO thin films were characterized by Zeta Potential, X-ray diffraction, Ultraviolet-Visible spectroscopy, atomic force microscopy, Fourier transform infrared spectroscopy, field emission scanning electron microscopy and energy dispersive X-ray spectrosc...
متن کاملFabrication and magnetic properties of Polyimide/Nickel Oxide nanocomposite
Polyimide/Nickel oxide (polyimide/NiO) nanocomposite was successfully synthesized by sol gel technique, using Pyromellitic dianhydriede (PMDA), 4,4-oxydianiline (ODA) and N,N-dimethylacetamide (DMAC) and 10 wt% Nickel titanate nanopowders (NPs). Fourier transform infrared spectrometry (FTIR), X-ray diffraction (XRD), scanning electron microscopy (SEM), and vibrating sample magnetometer (VSM) we...
متن کاملFabrication and magnetic properties of Polyimide/Nickel Oxide nanocomposite
Polyimide/Nickel oxide (polyimide/NiO) nanocomposite was successfully synthesized by sol gel technique, using Pyromellitic dianhydriede (PMDA), 4,4-oxydianiline (ODA) and N,N-dimethylacetamide (DMAC) and 10 wt% Nickel titanate nanopowders (NPs). Fourier transform infrared spectrometry (FTIR), X-ray diffraction (XRD), scanning electron microscopy (SEM), and vibrating sample magnetometer (VSM) we...
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ژورنال
عنوان ژورنال: Journal of The Surface Finishing Society of Japan
سال: 2008
ISSN: 0915-1869
DOI: 10.4139/sfj.59.562